Research Index / Ultrafast Technology / Sensitivity-Testing
We have demonstrated that our fiber-coupled, micromachined, photoconductive sampling probes can be utilized for in-situ testing and characterization of digital-microwave integrated circuits. Waveforms at the internal nodes of several GaAs and InP circuits have been captured to observe the circuit response when a signal was generated through illumination of a single transistor with a short laser pulse. The embodiment emulates disturbances in satellite circuits caused by cosmic radiation and will aid in the development of radiation-hard microelectronics.
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