MARCEL TUTT


Marcel Tutt received his Bachelor's and Master's Degrees in Electrical Engineering from the University of Waterloo in Canada and his Ph.D. from the University of Michigan in 1994.

His Ph.D. research primarily dealt with the low frequency and the high frequency noise properties of heterojunction transistors. His Master's thesis dealt with the analysis of microstripline structures using the Method of Moments.

Prior to pursuing the Ph.D. degree, he worked in the Military Avionics Division and the Systems Research Center of Honeywell. While at the University of Michigan, he developed noise characterization capability from baseband to 18Ghz and small signal characterization up to 100Ghz.

In May 1994 he joined Texas Instruments, Dallas, Texas, where he is currently working as a member of the Technical Staff. His current research interests include characterization and analysis of new device technologies for circuit and system applications.

Dr. Tutt participated in the following research programs:


[GaN] [InP] [GaAs] [MOCVD] [Mixer] [Gunn (NDR)] [PIN] [HBTs] [HEMTs] [MMICs]

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