Opteos offers a range of RF field detection and scanning systems based on unique, patented, electro-optic (EO) and magneto-optic (MO) technologies. The EO probes utilize the Pockels Effect for direct meausrement of electric fields. The MO probes are used to directly measure magnetic fields based on the Faraday Effect.
Opteos's EO and MO sensing systems can be used in a growing variety of applications including characterization, diagnosis, calibration and near field scanning of RF circuits, antennas and phased arrays, test and evaluation of high power microwave systems, medical device measurements, EMC/EMI testing, etc. [Opteos Website, Company]