EECS
EECS


Defense Event

Unreliable Silicon: Circuit through System-Level Techniques for Mitigating the Adverse Effects of Process Variation, Device Degradation and Environmental Conditions

Eric A. Karl


 
Thursday, March 06, 2008
4:00pm - 6:00pm
3725 Beyster Bldg.

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Additional Information

Email: beths@umich.edu

Sponsor(s): Dennis Sylvester & David Blaauw

Open to: Limited