ECE
ECE
ECE ECE


Defense Event

NBTI and Gate-oxide-degradation Sensing and Management in VLSI circuits

Prashant Singh


 
Tuesday, April 19, 2011
11:30am - 1:30pm
1005 EECS

Add to Google Calendar

Additional Information

Email: beths@umich.edu

Sponsor(s): David Blaauw

Open to: Public