EECS
EECS


Defense Event

Electrical Characterization of A1GaN/GaN MODFET: A reliability-driven low frequency noise-based study

Pouya Valizadeh


 
Tuesday, April 12, 2005
1:30pm - 3:30pm
1005 EECS

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Additional Information

Sponsor(s): Dimitris Pavliids

Open to: Public