| Mar 31, 2005 |
EECS Faculty and Students Receive Best Paper Award at DATE 2005 Conference
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| Professors John Hayes and Igor Markov, along with their students Smita Krishnaswamy and George Viamontes, were selected for a best paper award at the Design Automation and Test in Europe (DATE) 2005 Conference held in March in Munich, Germany. Their paper, titled “Accurate Reliablity Evaluation and Enhancement via Probabilistic Transfer Matrices” was chosen from over 800 entries. The award will be presented at a ceremony during DATE 2006. [More Info] |
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