| Sep 11, 2007 |
Predicting the Unpredictable in Nanoscale Circuits
|
 | Prof. John Hayes, Igor Markov, and graduate student Smita Krishnaswamy describe a first-of-a-kind technique to test non-deterministic parameters of nanocircuits in their article, "Tracking Uncertainty with Probabilistic Logic Circuit Testing." [Read more...] |
| |
|